Determining limitations of capacitance-voltage measurements of built-in voltage as an alternative to surface photovoltage for a-Si:H/c-Si heterojunctions
James Hack, Christoph Luderer, Christian Reichel, R. L. Opila, Martin Bivour
Topics & Concepts
HeterojunctionCapacitanceBand bendingMaterials scienceOptoelectronicsSurface photovoltageVoltageDepletion regionCrystalline siliconPhotovoltaic systemSemiconductorSiliconSchottky barrierDopingElectrical engineeringChemistryElectrodePhysicsDiodeQuantum mechanicsEngineeringPhysical chemistrySpectroscopySilicon and Solar Cell TechnologiesThin-Film Transistor TechnologiesSemiconductor materials and interfaces