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XRD peak broadening modelling for Al-alloys characterization compared with Rietveld profile analysis

Mostafa Y. A. Mostafa, Ahmed Mostafa, M.A. Abdel-Rahman, E.E. Assem, Ali M. Ashour, Emad A. Badawi

2023Materials Today Proceedings13 citationsDOI

Topics & Concepts

CrystalliteRietveld refinementMaterials scienceDislocationCharacterization (materials science)CrystallographyGrain sizeWork (physics)Flow stressThermodynamicsMetallurgyCrystal structureComposite materialChemistryStrain rateNanotechnologyPhysicsMicrostructure and mechanical propertiesAluminum Alloy Microstructure PropertiesNon-Destructive Testing Techniques
XRD peak broadening modelling for Al-alloys characterization compared with Rietveld profile analysis | Litcius