Wide–Narrow Row Planting Pattern Increases Root Lodging Resistance by Adjusting Root Architecture and Root Physiological Activity in Maize (Zea mays L.) in Northeast China
Shengqun Liu, Shulian Jian, Xiangnan Li, Yang Wang
Abstract
Root lodging (RL) in maize can reduce yield and grain quality. A wide–narrow row planting pattern can increase maize yield in the growing regions of northeastern China, but whether it can improve RL resistance is not clear. Therefore, in this study, the root architecture distribution, root physiological activity, and root lodging rate under planting pattern 1 (uniform ridge of 65 cm, east–west ridge direction) and pattern 2 (wide–narrow rows, 40 double narrow rows and 90 wide rows, north–south ridge direction) were studied. The results showed that the RL rate under pattern 2 was significantly lower than that under pattern 1. The number and diameter of nodal roots on the upper node, the root failure moment, and the root bleeding sap intensity at the 3 weeks after VT under pattern 2 were significantly higher than those under pattern 1. Root length density in the 0–40 cm soil layer tended to be inter-row distributed. Therefore, the RL resistance of maize under pattern 2 was increased through an adjustment in the root architecture distribution and root physiological activity in northeastern China.