Metal–2D multilayered semiconductor junctions: layer-number dependent Fermi-level pinning
Qian Wang, Yangfan Shao, Peng-Lai Gong, Xingqiang Shi
Abstract
Thickness-dependent performance of metal–two-dimensional semiconductor junctions in electronics/optoelectronics have attracted increasing attention but, currently, little knowledge about the micro-mechanism of this thickness dependence is available.
Topics & Concepts
Materials scienceSemiconductorLayer (electronics)MetalFermi levelElectronicsOptoelectronicsCondensed matter physicsNanotechnologyEngineering physicsMetallurgyElectrical engineeringElectronPhysicsEngineeringQuantum mechanics2D Materials and ApplicationsNanowire Synthesis and ApplicationsElectronic and Structural Properties of Oxides