Effect of percolation path on temperature dependence of threshold voltage variability in bulk MOSFETs
T. Mizutani, Kiyoshi Takeuchi, Takuya Saraya, Hiroshi Oka, Takahiro Mori, Masaharu Kobayashi, Toshiro Hiramoto
Abstract
Abstract The threshold voltage variability of bulk MOSFETs was measured at RT and cryogenic temperature and compared. It was found that the temperature dependences of the threshold voltage defined by extrapolation ( V THEX ) and the threshold voltage defined by constant current ( V THC ) show different behaviors and the percolation path in the channel, which is caused by a potential valley due to random dopant fluctuations, weakens the temperature dependence of V THC .
Topics & Concepts
Threshold voltageExtrapolationCondensed matter physicsPercolation thresholdPercolation (cognitive psychology)Materials scienceDopantVoltagePhysicsDopingElectrical resistivity and conductivityMathematicsTransistorBiologyQuantum mechanicsNeuroscienceMathematical analysisSemiconductor materials and devicesAdvancements in Semiconductor Devices and Circuit DesignSilicon Carbide Semiconductor Technologies