Litcius/Paper detail

Stacking faults in 4H–SiC epilayers and IGBTs

Pin Wang, Weiwei Cheng, Yifei Li, Yifei Li, Lei Xu, Peng‐Xiang Hou, Le Yu, Yun Li, Yun Li, Zheyang Li, Rui Jin

2024Materials Science in Semiconductor Processing20 citationsDOI

Topics & Concepts

Materials scienceStackingStacking faultOptoelectronicsEngineering physicsComposite materialDislocationNuclear magnetic resonancePhysicsEngineeringSilicon Carbide Semiconductor TechnologiesSilicon and Solar Cell TechnologiesElectromagnetic Compatibility and Noise Suppression
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