A physics-based drain current model for Si1-xGex source/drain NT JLFET for enhanced hot carrier reliability with temperature measurement
Anchal Thakur, Rohit Dhiman
Topics & Concepts
TransconductanceMaterials scienceOptoelectronicsReliability (semiconductor)Quantum tunnellingTransistorElectrical engineeringElectronic engineeringEngineeringPhysicsVoltagePower (physics)Quantum mechanicsAdvancements in Semiconductor Devices and Circuit DesignSilicon Carbide Semiconductor TechnologiesSemiconductor materials and devices