Scientific exploration with expert knowledge (SEEK) in autonomous scanning probe microscopy with active learning
Utkarsh Pratiush, Hiroshi Funakubo, Rama K. Vasudevan, Sergei V. Kalinin, Yongtao Liu
Abstract
This work introduces a knowledge-informed framework that integrates human expertise and prior interest into active learning-driven autonomous experimentation, which enhances the exploration efficiency through more targeted experimentation.
Topics & Concepts
NanotechnologyKnowledge managementComputer scienceMaterials scienceForce Microscopy Techniques and ApplicationsMechanical and Optical ResonatorsNanofabrication and Lithography Techniques