Bi-doped silica glass: A combined XPS – DFT study of electronic structure and pleomorphic imperfections
D. A. Zatsepin, A. F. Zatsepin, Danil W. Boukhvalov, Н. В. Гаврилов
Topics & Concepts
BismuthX-ray photoelectron spectroscopyMaterials scienceImpurityStoichiometryAmorphous solidElectronic structureDopingAnalytical Chemistry (journal)Valence (chemistry)OxideChemical physicsCrystallographyChemistryPhysical chemistryComputational chemistryChemical engineeringOptoelectronicsMetallurgyEngineeringOrganic chemistryChromatographyGlass properties and applicationsLuminescence Properties of Advanced MaterialsNuclear materials and radiation effects