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An edge-located uniform pattern recovery mechanism using statistical feature-based optimal center pixel selection strategy for local binary pattern

Shaokun Lan, Hongcheng Fan, Shiqi Hu, Xincheng Ren, Xuewen Liao, Zhibin Pan

2023Expert Systems with Applications22 citationsDOI

Topics & Concepts

Local binary patternsPixelPattern recognition (psychology)Artificial intelligenceFeature (linguistics)HistogramComputer scienceEnhanced Data Rates for GSM EvolutionFeature selectionSelection (genetic algorithm)Computer visionMathematicsImage (mathematics)LinguisticsPhilosophyImage Retrieval and Classification TechniquesAdvanced Image and Video Retrieval TechniquesMedical Image Segmentation Techniques
An edge-located uniform pattern recovery mechanism using statistical feature-based optimal center pixel selection strategy for local binary pattern | Litcius