Analysis of kerogens and model compounds by time-of-flight secondary ion mass spectrometry (TOF-SIMS)
Peter Sjövall, Kyle D. Bake, Andrew E. Pomerantz, Xiaohu Lu, Sudipa Mitra-Kirtley, Oliver C. Mullins
Topics & Concepts
ChemistryIonHeteroatomHydrogenMass spectrometryMoleculeMass spectrumCarbon fibersDissociation (chemistry)Analytical Chemistry (journal)DecompositionOrganic chemistryChromatographyMaterials scienceRing (chemistry)Composite numberComposite materialHydrocarbon exploration and reservoir analysisIon-surface interactions and analysisForensic Fingerprint Detection Methods