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VODCA: Verification of Diagnosis Using CAM-Based Approach for Explainable Process Monitoring

Cheolhwan Oh, Jongpil Jeong

2020Sensors18 citationsDOIOpen Access PDF

Abstract

Process monitoring at industrial sites contributes to system stability by detecting and diagnosing unexpected changes in a system. Today, as the infrastructure of industrial sites is advancing because of the development of communication technology, vast amounts of data are generated, and the importance of a way to effectively monitor such data in order to diagnose a system is increasing daily. Because a method based on a deep neural network can effectively extract information from a large amount of data, methods have been proposed to monitor processes using such networks to detect system faults and abnormalities. Neural-network-based process monitoring is effective in detecting faults, but has difficulty in diagnosing because of the limitations of the black-box model. Therefore, in this paper we propose a process-monitoring framework that can detect and diagnose faults. The proposed method uses a class activation map that results from diagnosis of faults and abnormalities, and verifies the diagnosis by post-processing the class activation map. This improves the detection of faults and abnormalities and generates a class activation map that provides a more verified diagnosis to the end user. In order to evaluate the performance of the proposed method, we did a simulation using publicly available industrial motor datasets. In addition, after establishing a system that can apply the proposed method to actual manufacturing companies that produce sapphire nozzles, we carried out a case study on whether fault detection and diagnosis were possible.

Topics & Concepts

Process (computing)Computer scienceArtificial neural networkFault (geology)Black boxFault detection and isolationClass (philosophy)Data miningReal-time computingArtificial intelligenceGeologySeismologyActuatorOperating systemFault Detection and Control SystemsIndustrial Vision Systems and Defect DetectionAnomaly Detection Techniques and Applications
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