Characterization at high spatial and angular resolutions of deformed nanostructures by on-axis HR-TKD
Clément Ernould, Benoît Beausir, Jean‐Jacques Fundenberger, Vincent Taupin, Emmanuel Bouzy
Topics & Concepts
Materials scienceCharacterization (materials science)Transmission electron microscopyDislocationDiffractionScanning electron microscopeNanostructureAngular resolution (graph drawing)Scanning transmission electron microscopyNanoscopic scaleOpticsResolution (logic)Electron backscatter diffractionHigh-resolution transmission electron microscopyImage resolutionKikuchi lineElectron diffractionNanotechnologyReflection high-energy electron diffractionComposite materialPhysicsCombinatoricsArtificial intelligenceComputer scienceMathematicsMicrostructure and mechanical propertiesAdvanced Electron Microscopy Techniques and ApplicationsAluminum Alloy Microstructure Properties