Atomic-scale fatigue mechanism of ferroelectric tunnel junctions
Yihao Yang, Ming Wu, Xingwen Zheng, Chunyan Zheng, Jibo Xu, Zhiyu Xu, Xiaofei Li, Xiaojie Lou, Di Wu, Xiaohui Liu, Stephen J. Pennycook, Zheng Wen
Abstract
FTJs. These results reveal an atomic-scale fatigue mechanism of ultrathin ferroelectric barriers associated with the aggregation of charged defects, facilitating the design of reliable FTJs and ferroelectric nanoelectronic devices for practical applications.
Topics & Concepts
FerroelectricityMechanism (biology)Atomic unitsMaterials scienceScale (ratio)OptoelectronicsNanotechnologyComposite materialPhysicsQuantum mechanicsDielectricFerroelectric and Piezoelectric MaterialsSemiconductor materials and devicesMetal and Thin Film Mechanics