The intelligent detection method for flip chips using CBN-S-Net algorithm with SAM images
Yuhua Sha, Zhenzhi He, Héctor Gutiérrez, Jiawei Du, Weiwei Yang, Xiangning Lu
Topics & Concepts
Flip chipInterconnectionMaterials scienceMicroelectronicsSolderingMeasure (data warehouse)Sample (material)ChipConvolution (computer science)Similarity (geometry)Electronic engineeringOptoelectronicsAlgorithmComputer scienceArtificial intelligenceArtificial neural networkNanotechnologyComposite materialEngineeringData miningTelecommunicationsLayer (electronics)Image (mathematics)AdhesiveChemistryChromatographyIndustrial Vision Systems and Defect DetectionIntegrated Circuits and Semiconductor Failure AnalysisImage Processing Techniques and Applications