Determining the mechanisms of deformation in flexible crystals using micro-focus X-ray diffraction
Amy J. Thompson, Anna Worthy, Arnaud Grosjean, Jason R. Price∥, John C. McMurtrie, Jack K. Clegg
Abstract
A newly developed methodology allows for the determination of the mechanisms of deformation in flexible crystals with atomic precision. With broader applications, mapping experiments have wide reaching potential within the field of materials science.
Topics & Concepts
Deformation (meteorology)Focus (optics)DiffractionMaterials scienceField (mathematics)X-rayNanotechnologyCrystallographyComputer scienceEngineering physicsOpticsComposite materialChemistryPhysicsPure mathematicsMathematicsX-ray Diffraction in CrystallographyForce Microscopy Techniques and ApplicationsAdvanced X-ray Imaging Techniques