A super high aspect ratio atomic force microscopy probe for accurate topography and surface tension measurement
Xiaolei Ding, Binyu Kuang, Chun Xiong, Renwei Mao, Yang Xu, Zhibin Wang, Huan Hu
Topics & Concepts
Focused ion beamMaterials scienceSurface tensionAspect ratio (aeronautics)FabricationPyramid (geometry)OpticsAtomic force microscopyEtching (microfabrication)NanostructureNanotechnologyOptoelectronicsIonChemistryPhysicsAlternative medicineLayer (electronics)PathologyMedicineQuantum mechanicsOrganic chemistryForce Microscopy Techniques and ApplicationsDiamond and Carbon-based Materials ResearchSurface and Thin Film Phenomena