Utilizing CNN to predict homogeneous thermo-mechanical properties of conductive layers for reliability numerical analysis in electronics
Guoshun Wan, Qi Dong, Xiaochen Sun, Hao Zheng, Mengxuan Cheng, Wen Qiao, Yuxi Jia
Topics & Concepts
HomogeneousElectrical conductorReliability (semiconductor)ElectronicsMaterials scienceComposite materialComputer scienceElectrical engineeringEngineeringPhysicsStatistical physicsThermodynamicsPower (physics)Advancements in Semiconductor Devices and Circuit DesignThermal properties of materialsSemiconductor materials and devices