New reliability model for complex systems based on stochastic processes and survival signature
Miaoxin Chang, Xianzhen Huang, Frank P. A. Coolen, Tahani Coolen‐Maturi
Topics & Concepts
Signature (topology)Reliability (semiconductor)Stochastic processComputer scienceStochastic modellingComponent (thermodynamics)Reliability theoryComplex systemStochastic orderingGamma processProcess (computing)Reliability engineeringWiener processFailure rateMathematicsApplied mathematicsStatisticsArtificial intelligenceEngineeringQuantum mechanicsOperating systemPower (physics)ThermodynamicsGeometryPhysicsReliability and Maintenance OptimizationProbabilistic and Robust Engineering DesignStatistical Distribution Estimation and Applications