Single-atom electron microscopy for energy-related nanomaterials
Mingquan Xu, Aowen Li, Meng Gao, Wu Zhou
Abstract
The advances in aberration correction have enabled atomic-resolution imaging and spectroscopy in scanning transmission electron microscopy (STEM) under low primary voltages and pushed their detection limit down to the single-atom level.
Topics & Concepts
Scanning transmission electron microscopyEnergy filtered transmission electron microscopyScanning confocal electron microscopyTransmission electron microscopyMaterials scienceAtom (system on chip)SpectroscopyResolution (logic)Electron tomographyNanomaterialsMicroscopyConventional transmission electron microscopeHigh-resolution transmission electron microscopyElectron microscopeElectron energy loss spectroscopyElectronNanotechnologyScanning electron microscopeOpticsAtomic physicsPhysicsComputer scienceNuclear physicsQuantum mechanicsEmbedded systemArtificial intelligenceAdvanced Electron Microscopy Techniques and ApplicationsElectron and X-Ray Spectroscopy TechniquesAdvanced Materials Characterization Techniques