Reliability Mechanisms of the Ultrathin-Layered BaTiO3-based BME MLCC
Chaoqiong Zhu, Ziming Cai, Peizhong Feng, Weichen Zhang, Kezhen Hui, Xiuhua Cao, Zhenxiao Fu, Xiaohui Wang
Topics & Concepts
Reliability (semiconductor)Materials scienceReliability engineeringOptoelectronicsEngineeringPhysicsPower (physics)Quantum mechanicsFerroelectric and Piezoelectric MaterialsAdvanced ceramic materials synthesisMicrowave Dielectric Ceramics Synthesis