Review of infrared spectroscopy techniques for the determination of internal structure in thin SiO2 films
Teresa de los Arcos, Hendrik Müller, Fuzeng Wang, Varun Raj Damerla, Christian Hoppe, Christian Weinberger, Michael Tiemann, Guido Grundmeier
Topics & Concepts
Specular reflectionMaterials scienceThin filmPorositySubstrate (aquarium)Mesoporous materialInfraredCharacterization (materials science)Reflection (computer programming)Infrared spectroscopyOpticsSpectroscopyOptoelectronicsComposite materialNanotechnologyChemistryComputer scienceOrganic chemistryGeologyOceanographyQuantum mechanicsPhysicsProgramming languageCatalysisSemiconductor materials and devicesSilicon Nanostructures and PhotoluminescenceZnO doping and properties