Litcius/Paper detail

Uncertainty-aware and dynamically-mixed pseudo-labels for semi-supervised defect segmentation

Dejene M. Sime, Guotai Wang, Zhi Zeng, Bei Peng

2023Computers in Industry24 citationsDOI

Topics & Concepts

SegmentationComputer scienceArtificial intelligenceLeverage (statistics)Machine learningSemi-supervised learningLabeled dataPattern recognition (psychology)Supervised learningAnnotationBoosting (machine learning)Deep learningArtificial neural networkIndustrial Vision Systems and Defect DetectionNon-Destructive Testing TechniquesIntegrated Circuits and Semiconductor Failure Analysis
Uncertainty-aware and dynamically-mixed pseudo-labels for semi-supervised defect segmentation | Litcius