Machine learning approach for reducing uncertainty in AFM nanomechanical measurements through selection of appropriate contact model
Linh Thi Phuong Nguyen, Bernard Haochih Liu
Topics & Concepts
Artificial intelligenceClassifier (UML)Elastic modulusAtomic force microscopyMachine learningComputer scienceContact angleLinear discriminant analysisMaterials sciencePattern recognition (psychology)Biological systemComposite materialNanotechnologyBiologyForce Microscopy Techniques and ApplicationsNanofabrication and Lithography TechniquesAdvanced Electron Microscopy Techniques and Applications