Characterization of PyC/SiC Interfaces with FIB-SEM Tomography
José David Arregui-Mena, Rachel L. Seibert, Tyler Gerczak
Topics & Concepts
Materials scienceSilicon carbideFocused ion beamScanning electron microscopeCharacterization (materials science)TomographySiliconComposite materialNuclear engineeringNanotechnologyIonOptoelectronicsOpticsChemistryPhysicsEngineeringOrganic chemistryNuclear reactor physics and engineeringNuclear Materials and PropertiesNuclear Physics and Applications