Probing the limits of full-field linear local defect resonance identification for deep defect detection
Joost Segers, Saeid Hedayatrasa, Gaétan Poelman, Wim Van Paepegem, Mathias Kersemans
Topics & Concepts
Materials scienceStiffnessNondestructive testingVibrationUltrasonic sensorAcousticsResonance (particle physics)Reduction (mathematics)OpticsComposite materialPhysicsGeometryMathematicsParticle physicsQuantum mechanicsUltrasonics and Acoustic Wave PropagationNon-Destructive Testing TechniquesThermography and Photoacoustic Techniques