Litcius/Paper detail

Automated detection of defects with low semantic information in X-ray images based on deep learning

Wangzhe Du, Hongyao Shen, Jianzhong Fu, Ge Zhang, Xuanke Shi, Quan He

2020Journal of Intelligent Manufacturing57 citationsDOI

Topics & Concepts

Computer scienceFeature (linguistics)Artificial intelligenceIntersection (aeronautics)Convolutional neural networkPattern recognition (psychology)Field (mathematics)Pyramid (geometry)OracleBaseline (sea)SegmentationDeep learningData miningEngineeringMathematicsGeologyGeometrySoftware engineeringPhilosophyAerospace engineeringLinguisticsOceanographyPure mathematicsIndustrial Vision Systems and Defect DetectionAdvanced X-ray and CT ImagingWelding Techniques and Residual Stresses
Automated detection of defects with low semantic information in X-ray images based on deep learning | Litcius