Litcius/Paper detail

The end-to-end chip surface defect segmentation method based on the diffusion model and attention mechanism

Zilin Xia, Yufan Zhao, Jinan Gu, Wenbo Wang, Zedong Huang, Yan Gao, Peiyue Sun

2025Engineering Applications of Artificial Intelligence11 citationsDOI

Topics & Concepts

Computer scienceEnd-to-end principleDiffusionMechanism (biology)SegmentationChipArtificial intelligenceComputer visionTelecommunicationsPhilosophyPhysicsEpistemologyThermodynamicsIndustrial Vision Systems and Defect DetectionSurface Roughness and Optical MeasurementsManufacturing Process and Optimization
The end-to-end chip surface defect segmentation method based on the diffusion model and attention mechanism | Litcius