Advanced multi-scale characterization of loess microstructure: Integrating μXCT and FIB-SEM for detailed fabric analysis and geotechnical implications
Bo Yu, Tom Dijkstra, Wen Fan, Ian Smalley, Ya-ni Wei, Longsheng Deng
Topics & Concepts
LoessGeotechnical engineeringCharacterization (materials science)MicrostructureScale (ratio)GeologyMaterials scienceComposite materialGeomorphologyNanotechnologyQuantum mechanicsPhysicsGeophysical Methods and ApplicationsMineral Processing and GrindingGeophysical and Geoelectrical Methods