Reliability estimation for one-shot devices under cyclic accelerated life-testing
Xiaojun Zhu, Kai Liu, Mu He, N. Balakrishnan
Topics & Concepts
Reliability (semiconductor)Reliability engineeringAccelerated life testingOne shotComputer scienceEngineeringMechanical engineeringStatisticsMathematicsPower (physics)Weibull distributionPhysicsQuantum mechanicsStatistical Distribution Estimation and ApplicationsReliability and Maintenance OptimizationFatigue and fracture mechanics