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Unsupervised Anomaly Detection Process Using LLE and HDBSCAN by Style-GAN as a Feature Extractor

Taeheon Lee, Yoon-Seok Kim, Youngjoo Hyun, Jeonghoon Mo, Youngjun Yoo

2023International Journal of Precision Engineering and Manufacturing12 citationsDOI

Topics & Concepts

Pattern recognition (psychology)Dimensionality reductionAnomaly detectionCluster analysisPrincipal component analysisArtificial intelligenceKernel (algebra)Singular value decompositionNoise (video)Computer scienceSupport vector machineMathematicsImage (mathematics)CombinatoricsAnomaly Detection Techniques and ApplicationsTime Series Analysis and ForecastingData-Driven Disease Surveillance
Unsupervised Anomaly Detection Process Using LLE and HDBSCAN by Style-GAN as a Feature Extractor | Litcius