Prediction of low-cycle fatigue crack development of sputtered Cu thin film using deep convolutional neural network
Michiaki Kamiyama, Kazuteru Shimizu, Yoshiaki AKINIWA
Topics & Concepts
Convolutional neural networkReliability (semiconductor)Materials scienceElectrical resistance and conductanceThin filmFatigue testingParis' lawComposite materialStructural engineeringComputer scienceArtificial intelligenceFracture mechanicsCrack closureEngineeringNanotechnologyPhysicsQuantum mechanicsPower (physics)Non-Destructive Testing TechniquesInfrastructure Maintenance and MonitoringIndustrial Vision Systems and Defect Detection