An algorithm for resolving intragranular orientation fields using coupled far-field and near-field high energy X-ray diffraction microscopy
Kelly E. Nygren, Darren C. Pagan, Joel V. Bernier, Matthew P. Miller
Topics & Concepts
DiffractionMaterials scienceAlgorithmOrientation (vector space)Lattice (music)MicrostructureField (mathematics)OpticsComputer scienceGeometryPhysicsMathematicsComposite materialAcousticsPure mathematicsMicrostructure and mechanical propertiesNon-Destructive Testing TechniquesForce Microscopy Techniques and Applications