Reliability analysis of thermal error model based on DBN and Monte Carlo method
Kuo Liu, Jiakun Wu, Haibo Liu, Mingjia Sun, Yongqing Wang
Topics & Concepts
Monte Carlo methodReliability (semiconductor)Computer scienceError analysisStructural reliabilityReliability engineeringStatistical physicsStatisticsMathematicsApplied mathematicsArtificial intelligenceEngineeringPhysicsThermodynamicsProbabilistic logicPower (physics)Advanced Measurement and Metrology TechniquesStructural Health Monitoring TechniquesTribology and Lubrication Engineering