On-machine evaluation of micro-EDM process signature in radio frequency (RF) domain: A step towards cost-effective data collection in a multiphysical process
Zequan Yao, Krishna Kumar Saxena, Vladimir Volski, Jun Qian, Guy Vandenbosch, Dominiek Reynaerts
Topics & Concepts
Signature (topology)Process (computing)Radio frequencyDomain (mathematical analysis)Frequency domainComputer scienceMaterials scienceTelecommunicationsMathematicsOperating systemComputer visionGeometryMathematical analysisAdvanced Machining and Optimization TechniquesNon-Destructive Testing TechniquesAdvanced machining processes and optimization