Characterization of the Percival detector with soft X-rays
A. Marras, Jonathan Correa, Sabine Lange, Vahagn Vardanyan, Tim Gerhardt, Manuela Kuhn, F. Kriváň, I. Shevyakov, Manfred Zimmer, Moritz Hoesch, Kai Bagschik, Frank Scholz, N. Guerrini, B. Marsh, I. Sedgwick, G. Cautero, D. Giuressi, Gregori Iztok, R.H. Menk, Martin Scarcia, L. Stebel, T. Nicholls, William F. Nichols, U. Pedersen, Polad M. Shikhaliev, N. Tartoni, H.J. Hyun, Seonghan Kim, KyungSook Kim, Seungyu Rah, A. Dawiec, F. Orsini, G. Pinaroli, A.L. Greer, Steve Aplin, April D. Jewell, Todd J. Jones, Shouleh Nikzad, Michael E. Hoenk, Frank Okrent, H. Graafsma, C. Wunderer
Abstract
In this paper the back-side-illuminated Percival 2-Megapixel (P2M) detector is presented, along with its characterization by means of optical and X-ray photons. For the first time, the response of the system to soft X-rays (250 eV to 1 keV) is presented. The main performance parameters of the first detector are measured, assessing the capabilities in terms of noise, dynamic range and single-photon discrimination capability. Present limitations and coming improvements are discussed.