High-performance 4-nm-resolution X-ray tomography using burst ptychography
Tomas Aidukas, Nicholas Phillips, Ana Díaz, Emiliya Poghosyan, E. Müller, A. F. J. Levi, Gabriel Aeppli, Manuel Guizar‐Sicairos, Mirko Holler
Topics & Concepts
PtychographyOpticsNanometreImage resolutionResolution (logic)Materials sciencePhysicsNanotechnologyOptoelectronicsDiffractionComputer scienceArtificial intelligenceAdvanced X-ray Imaging TechniquesAdvanced Electron Microscopy Techniques and ApplicationsLaser-Plasma Interactions and Diagnostics