A method for objectively evaluating the defect detection performance of in-situ monitoring systems
Henry C. de Winton, Frederic Cegla, Paul A. Hooper
Topics & Concepts
PhotodiodePorosityReceiver operating characteristicMaterials scienceComputer scienceArtificial intelligencePattern recognition (psychology)OptoelectronicsMachine learningComposite materialAdditive Manufacturing Materials and ProcessesAdditive Manufacturing and 3D Printing TechnologiesWelding Techniques and Residual Stresses