Large batch metrology on internal features of additively manufactured parts using X-ray computed tomography
Davis J. McGregor, Miles V. Bimrose, Sameh Tawfick, William P. King
Topics & Concepts
MetrologySoftwareNozzleProcess (computing)TomographyComputer scienceIndustrial computed tomographyMechanical engineeringEngineering drawingEngineeringOpticsPhysicsProgramming languageOperating systemAdvanced X-ray and CT ImagingAdditive Manufacturing Materials and ProcessesDental materials and restorations