Structural and Optical Properties of Interfacial InSe Thin Film
Cansu Emir, A. Tataroğlu, Emre Coşkun, Sema Bi̇lge Ocak
Abstract
High Resolution Image Download MS PowerPoint Slide This study presents a comprehensive investigation of the optical and structural characteristics of the indium selenide (InSe) film prepared on a glass substrate. The structural characteristics of the InSe film were analyzed using characterization techniques including X-ray diffraction, scanning electron microscopy, and energy-dispersive X-ray spectroscopy while the UV–vis spectrophotometry method was used in the spectral range between 500 and 1000 nm to examine the optical characteristics. Thus, the UV–vis spectroscopic data were used to extract several optical parameters including extinction coefficient ( k ), optical band gap ( E g ), refractive index ( n ), absorption coefficient (α), and optical conductivity (σ opt ). The optical transition of InSe was found as a direct transition. However, the optical analysis of this study has revealed that the InSe film has the potential to be used in various optoelectronic and photovoltaic applications.