On the Theory of X-ray Diffraction Interferometry in Single Crystals. Peculiarities of Effect and Possibilities of Application
V. G. Kohn, I. A. Smirnova
Abstract
Abstract A new version of X-ray diffraction interferometer in a single crystal is studied theoretically. This device is similar to the Young interferometer with two slits, but, instead of slits, it is proposed to use a bilens interferometer based on compound refractive lenses, which have already been created and are used in practice. The crystal makes it possible to reduce radically the interferometer sizes and provides additional possibilities for increasing the measurement accuracy. The features and structure of interference fringes, as well as the possibilities of practical use of the new-type interferometer are analyzed. Numerical calculations were performed using a universal computer program, which is being developed to solve a wide range of problems in X-ray optics.