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Morphological characterization and mechanical behavior by dicing and thinning on direct bonded Si wafer

Fumihiro Inoue, Arnita Podpod, Lan Peng, Alain Phommahaxay, Kenneth June Rebibis, Akira Uedono, Eric Beyne

2020Journal of Manufacturing Processes19 citationsDOI

Topics & Concepts

Wafer dicingWaferMaterials scienceWafer bondingAnodic bondingBreakageSurface finishComposite materialThinningDie preparationDie (integrated circuit)OptoelectronicsNanotechnologyEcologyBiology3D IC and TSV technologiesElectronic Packaging and Soldering TechnologiesAdvanced Surface Polishing Techniques
Morphological characterization and mechanical behavior by dicing and thinning on direct bonded Si wafer | Litcius