MaMiNet: Memory-attended multi-inference network for surface-defect detection
Xiaoyan Luo, Sen Li, Yu Wang, Tiancheng Zhan, Xiaofeng Shi, Bo Liu
Topics & Concepts
InferenceComputer scienceArtificial intelligenceFuse (electrical)Pattern recognition (psychology)PixelFeature (linguistics)AnnotationField (mathematics)Data miningRepresentation (politics)Machine learningComputer visionEngineeringMathematicsPhilosophyElectrical engineeringPoliticsLinguisticsLawPolitical sciencePure mathematicsIndustrial Vision Systems and Defect DetectionInfrastructure Maintenance and MonitoringAdvanced Neural Network Applications