Thickness dependent optical properties of amorphous/polycrystalline Ga2O3 thin films grown by plasma-enhanced atomic layer deposition
Weiming Liu, Junbo He, Xudan Zhu, Tiantian Huang, Xin Chen, Yu-Xiang Zheng, Liang‐Yao Chen, Rongjun Zhang
Topics & Concepts
Materials scienceCrystalliteAmorphous solidBand gapThin filmAtomic layer depositionOptoelectronicsRefractive indexSapphireEllipsometryAnnealing (glass)OpticsAnalytical Chemistry (journal)NanotechnologyLaserChemistryCrystallographyComposite materialPhysicsMetallurgyChromatographyGa2O3 and related materialsZnO doping and propertiesMultiferroics and related materials