Investigating multiple defects on a new fault-tolerant three-input QCA majority gate
Seyed Amir Hossein Foroutan, Reza Sabbaghi‐Nadooshan, Majid Mohammadi, Mohammad Bagher Tavakoli
Topics & Concepts
Computer scienceCMOSQuantum dot cellular automatonAdderElectronic circuitFault toleranceDigital electronicsCellular automatonLogic gateElectronic engineeringElectrical engineeringAlgorithmEngineeringDistributed computingQuantum-Dot Cellular AutomataAdvanced Memory and Neural ComputingSemiconductor materials and devices