A DRV-based bit selection method for SRAM PUF key generation and its impact on ECCs
A. Santana-Andreo, P. Sarazá-Canflanca, H. Carrasco-Lopez, Piedad Brox, R. Castro‐López, E. Roca, F.V. Fernández
Topics & Concepts
Static random-access memoryReliability (semiconductor)Reliability engineeringMetric (unit)Power (physics)Computer scienceKey (lock)Electronic engineeringReduction (mathematics)Selection (genetic algorithm)Embedded systemComputer hardwareEngineeringMathematicsPhysicsArtificial intelligenceGeometryOperations managementQuantum mechanicsComputer securityPhysical Unclonable Functions (PUFs) and Hardware SecurityIntegrated Circuits and Semiconductor Failure AnalysisAdvanced Memory and Neural Computing