Damage mapping via electrical impedance tomography in complex AM shapes using mixed smoothness and Bayesian regularization
Tyler N. Tallman, Laura Homa, Mark Flores, John Wertz
Topics & Concepts
Electrical impedance tomographyRegularization (linguistics)Inverse problemSmoothnessGaussianTomographyComputer scienceElectrical impedanceAlgorithmArtificial intelligenceMathematicsEngineeringMathematical analysisPhysicsOpticsElectrical engineeringQuantum mechanicsElectrical and Bioimpedance TomographyNon-Destructive Testing TechniquesMicrofluidic and Bio-sensing Technologies