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X-ray Diffraction for the Determination of Residual Stress of Crystalline Material: An Overview

Arijit Lodh, Khushahal Thool, I. Samajdar

2022Transactions of the Indian Institute of Metals61 citationsDOI

Topics & Concepts

Residual stressDiffractionMaterials scienceNeutron diffractionResidualElectron backscatter diffractionX-ray crystallographyOpticsComposite materialComputer scienceAlgorithmPhysicsWelding Techniques and Residual StressesFatigue and fracture mechanicsNon-Destructive Testing Techniques
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