Unsupervised surface defect detection of aluminum sheets with combined bright-field and dark-field illumination
Qian Sun, Ke Xu, Huajie Liu, Jianer Wang
Topics & Concepts
Computer scienceArtificial intelligenceField (mathematics)Dark field microscopySegmentationPattern recognition (psychology)Anomaly detectionArtificial neural networkVisibilitySurface (topology)Matching (statistics)Light fieldFeature (linguistics)OpticsPhysicsMathematicsMicroscopyStatisticsLinguisticsPure mathematicsPhilosophyGeometryIndustrial Vision Systems and Defect DetectionOptical measurement and interference techniquesSurface Roughness and Optical Measurements