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Magnetometry Based on Silicon-Vacancy Centers in Isotopically Purified <mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" display="inline" overflow="scroll"><mml:mn>4</mml:mn><mml:mi>H</mml:mi></mml:math>-<mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" display="inline" overflow="scroll"><mml:mi>SiC</mml:mi></mml:math>

Ignas Lekavicius, S.G. Carter, Daniel J. Pennachio, Samuel T. White, Jenifer R. Hajzus, Andrew P. Purdy, D. Kurt Gaskill, Andrew L. Yeats, Rachael L. Myers‐Ward

2023Physical Review Applied21 citationsDOI

Abstract

Point defects in solid-state materials are promising systems in the fields of quantum information, communications, and sensing. Particular to sensing, defects with coherent spin states are used for high-sensitivity room-temperature sensing under ambient conditions. Applications involving magnetic sensing with point defects are mostly dominated by the nitrogen-vacancy center in diamond, which possesses an attractive combination of spin coherence at room temperature as well as spin initialization and read-out. However, spin defects in other materials are explored as alternatives, especially in industrially mature materials, such as silicon carbide. Here, we report on the improved sensitivity of a magnetic sensor system utilizing an ensemble of silicon vacancies in silicon carbide due to isotopic purification of the host crystal. A maximum sensitivity of 4.0 nT/\ensuremath{\surd}Hz is reported, representing an order of magnitude improvement from the best previously reported sensitivity. Additional sensing modalities, such as angle-resolved magnetic imaging and highly broadband ac field sensing, are also demonstrated.

Topics & Concepts

Sensitivity (control systems)SiliconSilicon carbideMaterials scienceMagnetometerMagnetic fieldSpin (aerodynamics)InitializationVacancy defectPhysicsCondensed matter physicsOptoelectronicsComputer scienceElectronic engineeringQuantum mechanicsThermodynamicsProgramming languageMetallurgyEngineeringDiamond and Carbon-based Materials ResearchMetal and Thin Film MechanicsAdvanced Surface Polishing Techniques
Magnetometry Based on Silicon-Vacancy Centers in Isotopically Purified <mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" display="inline" overflow="scroll"><mml:mn>4</mml:mn><mml:mi>H</mml:mi></mml:math>-<mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" display="inline" overflow="scroll"><mml:mi>SiC</mml:mi></mml:math> | Litcius